Browsing by Subject Voltage and Temperature (PVT) Variations
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| Issue Date | Preview | Title | Author(s) | Advisor | Program | Document Type |
|---|---|---|---|---|---|---|
| 9-Mar-2018 |  | The impact of voltage scaling over delay elements with focus on post-silicon tests | Heck, Guilherme | Calazans, Ney Laert Vilar | Programa de Pós-Graduação em Ciência da Computação | Tese |