Estimativa da incerteza de medição de um sistema utilizado para caracterização eletrônica de materiais semicondutores

Abstract

The purpose of this paper was to present a case on the application of the classic method for the evaluation of measurement data and expression of uncertainty in measurement. The object of study was a semiconductor crystal defined as test sample based on their electronic structure. The measurement system allow characterizing the sample by Van der Pauw technique and Hall effect to determine the resistivity and the Hall coefficient of the crystal. The choice of the semiconductor as the object of study and an electronic characterization method for evaluation of uncertainty in measurement is due to its importance in the manufacture of devices used in virtually all electronic products. Firstly, there was be a review of the literature about the characteristics of semiconductors for understanding the results that was be obtained; then, developing a research of physical phenomena that explain the measurements; and finally the presentation of the technical characteristics of the measuring system designed to obtain the values of the study variables. Eventually, classic method was be present and the inherent sources of uncertainty in measurement process was be analyzed as well as the physical phenomena involved and identifying the components that do not affect the measurement results. The final product of this work was be an uncertainty budget for evaluation of measurements. This worksheet was be developed for the measurement system used in this work. However, it is proposed that it should be is tested by other users to evaluate the results obtained with another set of measuring instruments.